In the museum catalogue
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View at the museum ↗The Metropolitan Museum of Art
Panorama of New York and Vicinity
John Bachmann|John Weik|P. S. Duval and Son1868
- Attribution
- | | John Bachmann|John Weik|P. S. Duval and Son | | American, born Switzerland, 1814/15–1896|American (born Germany), Württemberg ca. 1827–ca. 1890 Philadelphia, Pennsylvania|Philadelphia, Pennsylvania
- Medium
- Lithograph with tint stone
- Physical dimensions
- image: 24 7/8 x 36 1/8 in. (63.2 x 91.8 cm) sheet: 26 7/16 x 37 1/2 in. (67.2 x 95.3 cm)
- Credit line
- The Edward W. C. Arnold Collection of New York Prints, Maps and Pictures, Bequest of Edward W. C. Arnold, 1954
CATALOGUE RECORD
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Source rights statement: Public-domain image eligibility not established by this export
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